Atomic Force Microscopes Market

Transparency Market Research

Single User License:

USD 4315.5

 Flat 10% Discount!!

Atomic Force Microscopes Market - Global

 Free Customization as per your requirement

Industry Analysis, Size, Share, Growth,

 You will get Custom Report at Syndicated

Trends and Forecast 2015 – 2023

Report price

 Report will be delivered with in 15-20

working days

Request Sample

Transparency Market Research

State Tower,

90, State Street, Suite 700.

Albany, NY 12207

United States

www.transparencymarketresearch.com

sales@transparencymarketresearch.com

Buy Now

REPORT DESCRIPTION

Atomic force microscopes refer to the scanning probe microscopes that are designed to measure several properties

such as height, magnetism and friction with the help of a probe. This type of microscope measures the local property

simultaneously by scanning the probe over a small area of the sample. Atomic force microscopy (AFM) shares its key

components with the scanning microscopy except for the probe tip. Typically atomic force microscopes operate in

three basic modes namely contact, noncontact and tapping mode. Contact mode monitors the interaction forces in

the sample as the cantilever tip is in contact with the sample. When there is a need for measurement of attributes

such as magnetic or electric or atomic forces of the sample then noncontact mode is adopted that involves the slight

movement of cantilever over the sample surface and oscillating cantilever near its natural resonance frequency.

However, tapping mode of operation represents the combination of both contact and noncontact modes.

Browse the full Atomic Force Microscopes Market report at

http://www.transparencymarketresearch.com/atomic-force-microscopes-market.html

Atomic force microscopy represents improved resolution microscopy technique that enables the production of

precise topographic images of the sample with the help of a nanometer scale probe that facilitates the scanning of

the sample surface. One of the unique advantages of AFM...