Atomic Force Microscopes Market - Global Industry Analysis, Size, Share, Growth, Trends and Forecast 2015 - 2023

Atomic force microscopes refer to the scanning probe microscopes that are designed to measure several properties such as height, magnetism and friction with the help of a probe. This type of microscope measures the local property simultaneously by scanning the probe over a small area of the sample. Atomic force microscopy (AFM) shares its key components with the scanning microscopy except for the probe tip. Typically atomic force microscopes operate in three basic modes namely contact, noncontact and tapping mode. Contact mode monitors the interaction forces in the sample as the cantilever tip is in contact with the sample. When there is a need for measurement of attributes such as magnetic or electric or atomic forces of the sample then noncontact mode is adopted that involves the slight movement of cantilever over the sample surface and oscillating cantilever near its natural resonance frequency. However, tapping mode of operation represents the combination of both contact and noncontact modes.

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Atomic force microscopy represents improved resolution microscopy technique that enables the production of precise topographic images of the sample with the help of a nanometer scale probe that facilitates the scanning of the sample surface. One of the unique advantages of AFM is that it permits imaging with minimal sample preparation in two environments such as air and water. AFM facilitates the visualization of single biomolecules, tissues and live cells at a high (nanoscale) resolution without drying or coating them. Unlike conventional microscopes these do not use lenses and hence the size of the probe generally limits their resolution.

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Owing to the ability of high resolution imaging of the biological samples without disrupting...