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REPORT DESCRIPTION
Atomic force microscopes refer to the scanning probe microscopes that are designed to measure several properties
such as height, magnetism and friction with the help of a probe. This type of microscope measures the local property
simultaneously by scanning the probe over a small area of the sample. Atomic force microscopy (AFM) shares its key
components with the scanning microscopy except for the probe tip. Typically atomic force microscopes operate in
three basic modes namely contact, noncontact and tapping mode. Contact mode monitors the interaction forces in
the sample as the cantilever tip is in contact with the sample. When there is a need for measurement of attributes
such as magnetic or electric or atomic forces of the sample then noncontact mode is adopted that involves the slight
movement of cantilever over the sample surface and oscillating cantilever near its natural resonance frequency.
However, tapping mode of operation represents the combination of both contact and noncontact modes.
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Atomic force microscopy represents improved resolution microscopy technique that enables the production of
precise topographic images of the sample with the help of a nanometer scale probe that facilitates the scanning of
the sample surface. One of the unique advantages of AFM...