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Date Submitted: 12/15/2015 01:07 AM
Scanning probe microscope (SPM) is an advanced microscope that uses a physical probe to scan the specimen. These microscopes provide high magnification and are specifically used for observation of three-dimensional specimens. In 1981, it was introduced as a pioneer in providing high atomic resolution. Initially, SPMs were mainly used for measuring 3D surface topography. Although they are now being used for measuring many other surface properties, they are still used primarily for 3D topography. SPMs were the first to produce real-space images of atomic arrangements on flat surfaces. This is done by moving a sharp probe over the sample. The interaction of the probe and sample, and the pressure created, are monitored, and that decides image resolution.
Technavio's analysts forecast the global SPM market to grow at a CAGR of 9.76% during the period 2014-2019.
Browse Detail Report With TOC @ http://www.hexareports.com/report/global-scanning-probe-microscopy-market/details
Covered in this report
The report covers the present scenario and growth prospects of the global SPM market for the period 2015-2019. To calculate the market size, the report considers revenue generated through sales of SPMs in the market.
The market is divided into the following segments based on the type of product:
Atomic force microscopes (AFM)
Scanning tunneling microscopes
Other SPM technologies
Technavio's report, Global SPM Market 2015-2019, has been prepared based on an in-depth market analysis with inputs from industry experts. The report covers the Americas, APAC, and EMEA; it also covers the global SPM market landscape and its growth prospects over the coming years. The report also includes a discussion on the key vendors operating in this market.
Key geographies
Americas
APAC
EMEA
Key vendors
Asylum Research
Hitachi High-tech Instruments
Key Sight Technologies
NT-MDT
Park Systems
Other prominent vendors
AXT
Budget Sensors
Danish Micro...